Impurity effects in neutron-irradiated simple oxides: Implications for fusion devices
R. González; Y. Chen; D. Cáceres; I. Vergara
- 作者R. González; Y. Chen; D. Cáceres; I. Vergara
- 卷第250卷
- 印刷ISSN0168-583X
- 文件大小176.69KB
- 发表时间2006
- DOI10.1016/j.nimb.2006.04.132
- 页码324-329