![SPIE Proceedings [SPIE Optics East - Philadelphia, PA (Monday 25 October 2004)] Two- and Three-Dimensional Vision Systems for Inspection, Control, and Metrology II - Auto-calibration: new method and comparisons]()
SPIE Proceedings [SPIE Optics East - Philadelphia, PA (Monday 25 October 2004)] Two- and Three-Dimensional Vision Systems for Inspection, Control, and Metrology II - Auto-calibration: new method and comparisonsWu, Youfu; Harding, Kevin G.; Shen, Jun; Dai, Mo · 2004