Epitaxial Growth and Characterization of Single Crystal Ferromagnetic Shape Memory Co
2
NiGa Films
Shih, T. C.; Xie, J. Q.; Dong, J. W.; Dong, X. Y.; Srivastava, S.; Adelmann, C.; McKernan, S.; James, R. D.; Palmstrøm, C. J.
- 期刊名称Ferroelectrics
- 作者Shih, T. C.; Xie, J. Q.; Dong, J. W.; Dong, X. Y.; Srivastava, S.; Adelmann, C.; McKernan, S.; James, R. D.; Palmstrøm, C. J.
- 卷第342卷
- 期第1期
- 印刷ISSN0015-0193
- 电子ISSN1563-5112
- 文件大小1244.93KB
- 发表时间2006-10
- DOI10.1080/00150190600946096
- 页码35-42