[IEEE 2006 IEEE Information Assurance Workshop - West Point, NY (June 21-23)] 2006 IEEE Information Assurance Workshop - Foundations for Visual Forensic Analysis
- 作者Teerlink, S.; Erbacher, R.F.
- 文件大小733.73KB
- 发表时间2006
- DOI10.1109/iaw.2006.1652095
- 页码192-199
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