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Electronic properties of the Ce∕4H-SiC interface studied by x-ray photoemission spectroscopy

Electronic properties of the Ce∕4H-SiC interface studied by x-ray photoemission spectroscopy

M. Kildemo; U. Grossner; S. Raaen

作者M. Kildemo; U. Grossner; S. Raaen
卷第100卷
期第5期
文件大小379.97KB
发表时间2006
DOI10.1063/1.2338131

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