Impurity effects in ZnO and nitrogen-doped ZnO thin films fabricated by MOCVD
Xiaonan Li; Sally E. Asher; Sukit Limpijumnong; Brian M. Keyes; Craig L. Perkins; Teresa M. Barnes; Helio R. Moutinho; Joseph M. Luther; S.B. Zhang; Su-Huai Wei; Timothy J. Coutts
- 作者Xiaonan Li; Sally E. Asher; Sukit Limpijumnong; Brian M. Keyes; Craig L. Perkins; Teresa M. Barnes; Helio R. Moutinho; Joseph M. Luther; S.B. Zhang; Su-Huai Wei; Timothy J. Coutts
- 卷第287卷
- 期第1期
- 印刷ISSN0022-0248
- 文件大小245.94KB
- 发表时间2006
- DOI10.1016/j.jcrysgro.2005.10.050
- 页码94-100