Structure of Carrot Defects in 4H-SiC Epilayers
Zhang, X.; Ha, Seo Young; Benamara, M.; Skowronski, Marek; Sumakeris, Joseph J.; Ryu, Sei Hyung; Paisley, Michael J.; O'Loughlin, Michael J.
- 期刊名称Materials Science Forum
- 作者Zhang, X.; Ha, Seo Young; Benamara, M.; Skowronski, Marek; Sumakeris, Joseph J.; Ryu, Sei Hyung; Paisley, Michael J.; O'Loughlin, Michael J.
- 电子ISSN1662-9752
- 文件大小5758.32KB
- 发表时间2006
- DOI10.4028/www.scientific.net/MSF.527-529.327
- 页码327-332