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Novel mesoscale defect structure on NiO(1 0 0) surfaces by atomic force microscopy

Novel mesoscale defect structure on NiO(1 0 0) surfaces by atomic force microscopy

S.C. Petitto; C.L. Berrie; M.A. Langell

作者S.C. Petitto; C.L. Berrie; M.A. Langell
卷第600卷
期第17期
印刷ISSN0039-6028
文件大小497.05KB
发表时间2006
DOI10.1016/j.susc.2006.06.005
页码229-235

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