Accelerated Life Testing Method of Transmission
Kim, Hyoung Eui; Kim, Doh Sik; Lee, Yoon Pyo; Yoo, Yung Chul
- 期刊名称Key Engineering Materials
- 作者Kim, Hyoung Eui; Kim, Doh Sik; Lee, Yoon Pyo; Yoo, Yung Chul
- 电子ISSN1662-9795
- 文件大小363.05KB
- 发表时间2006
- DOI10.4028/www.scientific.net/KEM.326-328.1865
- 页码1865-1868