发现好书期刊，享受阅读乐趣

海量图书期刊资源，随时随地畅享阅读乐趣

[ACM Press the 43rd annual conference - San Francisco, CA, USA (2006.07.24-2006.07.28)] Proceedings of the 43rd annual conference on Design automation - DAC '06 - Variability driven gate sizing for binning yield optimization

[ACM Press the 43rd annual conference - San Francisco, CA, USA (2006.07.24-2006.07.28)] Proceedings of the 43rd annual conference on Design automation - DAC '06 - Variability driven gate sizing for binning yield optimization

Davoodi, Azadeh; Srivastava, Ankur

作者Davoodi, Azadeh; Srivastava, Ankur
文件大小662.63KB
发表时间2006
DOI10.1145/1146909.1147152

← 返回【学霸图书馆】主页