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X-ray radiography for development of defect-free electrochemical hydrogen meter for sodium systems

Bagavathiappan, S; Saravanan, T; Philip, John; Venkatraman, B; Jayakumar, T; Raj, Baldev

期刊名称Insight - Non-Destructive Testing and Condition Monitoring
作者Bagavathiappan, S; Saravanan, T; Philip, John; Venkatraman, B; Jayakumar, T; Raj, Baldev
卷第48卷
期第10期
印刷ISSN1354-2575
文件大小735.61KB
发表时间2006-10
DOI10.1784/insi.2006.48.10.597
页码597-602