REMOVED: Guest Editorial: Thermal, Mechanical and Multi-Physics Simulation and Experiments in Micro-Electronics and Micro-Systems
- 期刊名称Microelectronics Reliability
- 作者Wymysłowski, Artur; Vandevelde, Bart; Andersson, Dag
- 印刷ISSN0026-2714
- 文件大小94.39KB
- 发表时间2006-10
- DOI10.1016/j.microrel.2006.09.001
Direct optical monitoring on the rotating substrate holderAlfons Zöller · 2008
Plasmaunterstütztes Aufdampfverfahren eröffnet neue Perspektiven in der Brillen- und FeinoptikAlfons Zöller · 1997
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