Planar Hall effect of indium antimonide thin film on silicon and nickel–zinc ferrite substrates
- 作者Wonyoung Kim; Joonyeon Chang; Sukhee Han
- 卷第41卷
- 期第17期
- 印刷ISSN0022-2461
- 电子ISSN1573-4803
- 文件大小269.70KB
- 发表时间2006-09
- DOI10.1007/s10853-006-0275-5
- 页码5625-5629
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ErratumInternational Journal of Experimental Pathology · 2013
AcknowledgmentsPathology International · 2012
Author IndexPathology International · 2012
Subject IndexPathology International · 2012
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