Study of RF N− LDMOS critical electrical parameter drifts after a thermal and electrical ageing in pulsed RF

H. Maanane; M. Masmoudi; J. Marcon; M.A. Belaid; K. Mourgues; C. Tolant; K. Ketata; Ph. Eudeline

作者H. Maanane; M. Masmoudi; J. Marcon; M.A. Belaid; K. Mourgues; C. Tolant; K. Ketata; Ph. Eudeline
卷第46卷
印刷ISSN0026-2714
文件大小292.47KB
发表时间2006
DOI10.1016/j.microrel.2005.07.107
页码994-1000

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