Uncertainties in the determination of thermal emissivity by measurement of reflectance using Fourier transform spectrometers

P.A. van Nijnatten; M.G. Hutchins; N.B. Kilbey; A. Roos; K. Gelin; F. Geotti-Bianchini; P. Polato; C. Anderson; F. Olive; M. Köhl; R. Spragg; P. Turner

作者P.A. van Nijnatten; M.G. Hutchins; N.B. Kilbey; A. Roos; K. Gelin; F. Geotti-Bianchini; P. Polato; C. Anderson; F. Olive; M. Köhl; R. Spragg; P. Turner
卷第502卷
印刷ISSN0040-6090
文件大小129.16KB
发表时间2006
DOI10.1016/j.tsf.2005.07.262
页码164-169

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Uncertainties in the determination of thermal emissivity by measurement of reflectance using Fourier transform spectrometers