Relative Intensity Correction of Raman Spectrometers: NIST SRMs 2241 Through 2243 for 785 nm, 532 nm, and 488 nm/514.5 nm Excitation
Choquette, Steven J.; Etz, Edgar S.; Hurst, Wilbur S.; Blackburn, Douglas H.; Leigh, Stefan D.
- 期刊名称as/61/2/as-61-2-117.pdf
- 作者Choquette, Steven J.; Etz, Edgar S.; Hurst, Wilbur S.; Blackburn, Douglas H.; Leigh, Stefan D.
- 卷第61卷
- 期第2期
- 印刷ISSN0003-7028
- 文件大小331.98KB
- 发表时间2007
- DOI10.1366/000370207779947585
- 页码117-129