[Springer Series in Chemical Physics] Ultrafast Phenomena XV Volume 88 || Carrier Dependent Stability of a Semiconductor Lattice Measured with Femtosecond X-ray Diffraction

• 作者Corkum, Paul; Jonas, David M.; Miller, R. J. Dwayne.; Weiner, Andrew M.
• 文件大小189.88KB
• 发表时间2007
• DOI10.1007/978-3-540-68781-8_227
• 页码710-712