![[IEEE 2019 IEEE 3rd International Conference on Circuits, Systems and Devices (ICCSD) - Chengdu, China (2019.8.23-2019.8.25)] 2019 IEEE 3rd International Conference on Circuits, Systems and Devices (ICCSD) - A Scan-Chain Circuit Design for BRAM Test Based on CLB]()
[IEEE 2019 IEEE 3rd International Conference on Circuits, Systems and Devices (ICCSD) - Chengdu, China (2019.8.23-2019.8.25)] 2019 IEEE 3rd International Conference on Circuits, Systems and Devices (ICCSD) - A Scan-Chain Circuit Design for BRAM Test Based on CLBHe, Wang; Dayu, Zhang; Faming, Yang; Yue, Wang; Song, Zhang; Yanchao, Yang · 2019