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[IEEE 25th IEEE VLSI Test Symmposium - Berkeley, CA, USA (2007.05.6-2007.05.10)] 25th IEEE VLSI Test Symmposium (VTS'07) - Circuit Failure Prediction and Its Application to Transistor Aging

[IEEE 25th IEEE VLSI Test Symmposium - Berkeley, CA, USA (2007.05.6-2007.05.10)] 25th IEEE VLSI Test Symmposium (VTS'07) - Circuit Failure Prediction and Its Application to Transistor Aging

Agarwal, Mridul; Paul, Bipul C.; Zhang, Ming; Mitra, Subhasish

作者Agarwal, Mridul; Paul, Bipul C.; Zhang, Ming; Mitra, Subhasish
文件大小355.87KB
发表时间2007
DOI10.1109/VTS.2007.22
页码277-286

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