[IEEE 2007 IEEE International Conference on Microelectronic Test Structures - Bunkyo-ku, Japan (2007.03.19-2007.03.22)] 2007 IEEE International Conference on Microelectronic Test Structures - Impact of Sinter Process and Metal Coverage on Transistor Mismatching and Parameter Variations in Analog CMOS Technology

• 作者Wu, Xiaoju; Trogolo, Joe; Inoue, Flex; Chen, Zhenwu; Jones-Williams, Pam; Khan, Imran; Madhani, Praful
• 文件大小5693.17KB
• 发表时间2007
• DOI10.1109/ICMTS.2007.374457
• 页码69-73