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Properties of C
<sub/>84</sub>
and C
<sub/>24</sub>
H
<sub/>12</sub>
Molecular Ion Sources for Routine TOF-SIMS Analysis

Properties of C ₈₄ and C ₂₄ H ₁₂ Molecular Ion Sources for Routine TOF-SIMS Analysis

Biddulph, Gregory X.; Piwowar, Alan M.; Fletcher, John S.; Lockyer, Nicholas P.; Vickerman, John C.

期刊名称Analytical Chemistry
作者Biddulph, Gregory X.; Piwowar, Alan M.; Fletcher, John S.; Lockyer, Nicholas P.; Vickerman, John C.
卷第79卷
期第19期
印刷ISSN0003-2700
电子ISSN1520-6882
文件大小141.86KB
发表时间2007-10
DOI10.1021/ac071442x
页码7259-7266

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