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[IEEE 2007 IEEE Design and Diagnostics of Electronic Circuits and Systems - Krakow, Poland (2007.04.11-2007.04.13)] 2007 IEEE Design and Diagnostics of Electronic Circuits and Systems - Built in Defect Prognosis for Embedded Memories

[IEEE 2007 IEEE Design and Diagnostics of Electronic Circuits and Systems - Krakow, Poland (2007.04.11-2007.04.13)] 2007 IEEE Design and Diagnostics of Electronic Circuits and Systems - Built in Defect Prognosis for Embedded Memories

Dubey, Prashant; Garg, Akhil; Bhaskarani, Sravan Kumar

作者Dubey, Prashant; Garg, Akhil; Bhaskarani, Sravan Kumar
文件大小225.44KB
发表时间2007
DOI10.1109/ddecs.2007.4295275
页码1-6

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