[IEEE 2007 9th Electronics Packaging Technology Conference - Singapore (2007.12.10-2007.12.12)] 2007 9th Electronics Packaging Technology Conference - Analysis of the Effect of AC Noise on DC Bias of VGA for UHF RFID using Chip-package Co-modeling and Simulation
Lee, Hyein; Shim, Yujeong; Park, Hyungjeong; Ryu, Chunghyun; Yoon, Changwook; Kim, Joungho
- 作者Lee, Hyein; Shim, Yujeong; Park, Hyungjeong; Ryu, Chunghyun; Yoon, Changwook; Kim, Joungho
- 文件大小4998.43KB
- 发表时间2007
- DOI10.1109/eptc.2007.4469739
- 页码591-594