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[IEEE 2007 IEEE International Symposium on Circuits and Systems - New Orleans, LA, USA (2007.05.27-2007.05.30)] 2007 IEEE International Symposium on Circuits and Systems - GALS Based Shared Test Architecture for Embedded Memories

[IEEE 2007 IEEE International Symposium on Circuits and Systems - New Orleans, LA, USA (2007.05.27-2007.05.30)] 2007 IEEE International Symposium on Circuits and Systems - GALS Based Shared Test Architecture for Embedded Memories

Dubey, Prashant; Garg, Akhil; Bhaskarani, Sravan Kumar

作者Dubey, Prashant; Garg, Akhil; Bhaskarani, Sravan Kumar
文件大小298.21KB
发表时间2007
DOI10.1109/iscas.2007.378245
页码157-160

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