Electrothermal Characterization for Reliability of Modern Low-Voltage PowerMOSFETs
- 期刊名称IEEE Transactions on Device and Materials Reliability
- 作者Castellazzi, Alberto; Ciappa, Mauro
- 卷第7卷
- 期第4期
- 印刷ISSN1530-4388
- 文件大小1046.96KB
- 发表时间2007-12
- DOI10.1109/TDMR.2007.910439
- 页码571-580
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