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[IEEE 2007 IEEE Instrumentation & Measurement Technology Conference IMTC 2007 - Warsaw, Poland (2007.05.1-2007.05.3)] 2007 IEEE Instrumentation & Measurement Technology Conference IMTC 2007 - Model-based test for analog integrated circuits

[IEEE 2007 IEEE Instrumentation & Measurement Technology Conference IMTC 2007 - Warsaw, Poland (2007.05.1-2007.05.3)] 2007 IEEE Instrumentation & Measurement Technology Conference IMTC 2007 - Model-based test for analog integrated circuits

Lee Barford, ; Tufillaro, Nick; Jefferson, Stan; Khoche, Ajay

作者Lee Barford, ; Tufillaro, Nick; Jefferson, Stan; Khoche, Ajay
文件大小4521.45KB
发表时间2007
DOI10.1109/imtc.2007.379053
页码1-6

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