[IEEE 2007 2nd International Design and Test Workshop - Cairo, Egypt (2007.12.16-2007.12.18)] 2007 2nd International Design and Test Workshop - An auto-Sensitivity Control Circuit Using Analog Topology for Wired CDMA Bus Interface
Eltokhy, Mostafa Aly Refay; Mansour, H. A. K.; Abd-Elhameed, M. E.
作者Eltokhy, Mostafa Aly Refay; Mansour, H. A. K.; Abd-Elhameed, M. E.