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[IEEE IEEE Computer Society Annual Symposium on VLSI (ISVLSI '07) - Porto Alegre, Brazil (2007.03.9-2007.03.11)] IEEE Computer Society Annual Symposium on VLSI (ISVLSI '07) - Low Area Adaptive Fail-Data Compression Methodology for Defect Classification and Production Phase Prognosis

[IEEE IEEE Computer Society Annual Symposium on VLSI (ISVLSI '07) - Porto Alegre, Brazil (2007.03.9-2007.03.11)] IEEE Computer Society Annual Symposium on VLSI (ISVLSI '07) - Low Area Adaptive Fail-Data Compression Methodology for Defect Classification and Production Phase Prognosis

Dubey, Prashant; Garg, Akhil; Bhaskarani, Sravan Kumar

作者Dubey, Prashant; Garg, Akhil; Bhaskarani, Sravan Kumar
文件大小220.30KB
发表时间2007
DOI10.1109/isvlsi.2007.63
页码171-178

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