Microstructural evolution and dielectric properties of SiO2-doped CaCu3Ti4O12 ceramics
- 作者Kang-Min Kim; Sun-Jung Kim; Jong-Heun Lee; Doh-Yeon Kim
- 卷第27卷
- 印刷ISSN0955-2219
- 文件大小1133.68KB
- 发表时间2007
- DOI10.1016/j.jeurceramsoc.2007.02.081
- 页码3991-3995
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