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Current-carrying property and microstructure of multilayered Sm1+xBa2−xCu3Oy thick films

Current-carrying property and microstructure of multilayered Sm1+xBa2−xCu3Oy thick films

T. Ozaki; Y. Yoshida; M. Miura; Y. Ichino; Y. Takai; K. Matsumoto; A. Ichinose; S. Horii; M. Mukaida
  • 作者T. Ozaki; Y. Yoshida; M. Miura; Y. Ichino; Y. Takai; K. Matsumoto; A. Ichinose; S. Horii; M. Mukaida
  • 印刷ISSN0921-4534
  • 文件大小162.06KB
  • 发表时间2007
  • DOI10.1016/j.physc.2007.03.463
  • 页码649-652
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