Control of embedded Si nanocrystals in SiO2 by rapid thermal annealing and enhanced photoluminescence characterization

• 作者T.S. Iwayama; T. Hama; D.E. Hole; I.W. Boyd
• 卷第201卷
• 印刷ISSN0257-8972
• 文件大小374.97KB
• 发表时间2007
• DOI10.1016/j.surfcoat.2006.12.032
• 页码8490-8494