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SPIE Proceedings [SPIE Optical Metrology - Munich, Germany (Monday 18 June 2007)] Modeling Aspects in Optical Metrology - <title>Sharp trench waveguide bend with photonic crystals: simulation, fabrication and characterization</title>

SPIE Proceedings [SPIE Optical Metrology - Munich, Germany (Monday 18 June 2007)] Modeling Aspects in Optical Metrology - Sharp trench waveguide bend with photonic crystals: simulation, fabrication and characterization

Cui, Xudong; Hafner, Christian; Robin, Franck; Erni, Daniel; Tavzarashvili, Kakhaber; Vahldieck, Ruediger; Bosse, Harald; Bodermann, Bernd; Silver, Richard M.
  • 作者Cui, Xudong; Hafner, Christian; Robin, Franck; Erni, Daniel; Tavzarashvili, Kakhaber; Vahldieck, Ruediger; Bosse, Harald; Bodermann, Bernd; Silver, Richard M.
  • 卷第6617卷
  • 印刷ISSN0277-786X
  • 文件大小493.40KB
  • 发表时间2007
  • DOI10.1117/12.726017
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