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Use of statistical parametric mapping (SPM) to enhance electrical impedance tomography (EIT) image sets

Use of statistical parametric mapping (SPM) to enhance electrical impedance tomography (EIT) image sets

R. J. Yerworth; Y. Zhang; T. Tidswell; R. H. Bayford; D. S. Holder

作者R. J. Yerworth; Y. Zhang; T. Tidswell; R. H. Bayford; D. S. Holder
文件大小751.99KB
发表时间2007
DOI10.1088/0967-3334/28/7/S11

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