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Segmentation of defects from radiography images by the histogram concavity threshold method

Segmentation of defects from radiography images by the histogram concavity threshold method

Saravanan, T; Bagavathiappan, S; Philip, John; Jayakumar, T; Raj, Baldev
  • 期刊名称Insight - Non-Destructive Testing and Condition Monitoring
  • 作者Saravanan, T; Bagavathiappan, S; Philip, John; Jayakumar, T; Raj, Baldev
  • 卷第49卷
  • 期第10期
  • 印刷ISSN1354-2575
  • 文件大小585.47KB
  • 发表时间2007-10
  • DOI10.1784/insi.2007.49.10.578
  • 页码578-584
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