![[ACM Press the 16th ACM/IEEE international symposium - Austin, Texas, USA (2010.08.18-2010.08.20)] Proceedings of the 16th ACM/IEEE international symposium on Low power electronics and design - ISLPED '10 - Post-silicon power characterization using thermal infrared emissions]()
[ACM Press the 16th ACM/IEEE international symposium - Austin, Texas, USA (2010.08.18-2010.08.20)] Proceedings of the 16th ACM/IEEE international symposium on Low power electronics and design - ISLPED '10 - Post-silicon power characterization using thermal infrared emissionsCochran, Ryan; Nowroz, Abdullah Nama; Reda, Sherief · 2010