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[IEEE 16th Asian Test Symposium (ATS 2007) - Beijing, China (2007.10.8-2007.10.11)] 16th Asian Test Symposium (ATS 2007) - Fault-dependent/independent Test Generation Methods for State Observable FSMs

[IEEE 16th Asian Test Symposium (ATS 2007) - Beijing, China (2007.10.8-2007.10.11)] 16th Asian Test Symposium (ATS 2007) - Fault-dependent/independent Test Generation Methods for State Observable FSMs

Hosokawa, Toshinori; Inoue, Ryoichi; Fujiwara, Hideo

作者Hosokawa, Toshinori; Inoue, Ryoichi; Fujiwara, Hideo
文件大小334.04KB
发表时间2007
DOI10.1109/ats.2007.4388025
页码275-280

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