SPIE Proceedings [SPIE International Symposium on Photoelectronic Detection and Imaging: Technology and Applications 2007 - Beijing, China (Sunday 9 September 2007)] International Symposium on Photoelectronic Detection and Imaging 2007: Image Processing - Research on the adaptive probabilistic approach of texture analysis and its application in texture classification
- 作者Cai, De; Zhou, Liwei; Hong, Wen; Wu, Yirong
- 卷第6623卷
- 印刷ISSN0277-786X
- 文件大小387.75KB
- 发表时间2007
- DOI10.1117/12.791429
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