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Defects in electronics and their significance for structural integrity

Defects in electronics and their significance for structural integrity

W. J. PLUMBRIDGE
  • 作者W. J. PLUMBRIDGE
  • 卷第30卷
  • 期第5期
  • 印刷ISSN8756-758X
  • 电子ISSN1460-2695
  • 文件大小545.22KB
  • 发表时间2007
  • DOI10.1111/j.1460-2695.2006.01060.x
  • 页码432-442
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