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[IEEE 2008 15th IEEE International Conference on Image Processing - San Diego, CA, USA (2008.10.12-2008.10.15)] 2008 15th IEEE International Conference on Image Processing - Unifying analysis of full reference image quality assessment

[IEEE 2008 15th IEEE International Conference on Image Processing - San Diego, CA, USA (2008.10.12-2008.10.15)] 2008 15th IEEE International Conference on Image Processing - Unifying analysis of full reference image quality assessment

Seshadrinathan, Kalpana; Bovik, Alan C.

作者Seshadrinathan, Kalpana; Bovik, Alan C.
文件大小158.72KB
发表时间2008
DOI10.1109/icip.2008.4711976
页码1200-1203

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