[Springer Proceedings in Physics] Microscopy of Semiconducting Materials 2007 Volume 120 || Hydrogenated Nanocrystalline Silicon Investigated by Conductive Atomic Force Microscopy
Cullis, A. G.; Midgley, P. A.
- 作者Cullis, A. G.; Midgley, P. A.
- 文件大小1690.07KB
- 发表时间2008
- DOI10.1007/978-1-4020-8615-1_65
- 页码301-304