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EMC 2008 14th European Microscopy Congress 1–5 September 2008, Aachen, Germany || Response function of the semiconductor detector of backscattered electrons in SEM

EMC 2008 14th European Microscopy Congress 1–5 September 2008, Aachen, Germany || Response function of the semiconductor detector of backscattered electrons in SEM

Luysberg, Martina; Tillmann, Karsten; Weirich, Thomas

作者Luysberg, Martina; Tillmann, Karsten; Weirich, Thomas
文件大小268.64KB
发表时间2008
DOI10.1007/978-3-540-85156-1_302
页码603-604

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