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[IEEE 2008 7th International Caribbean Conference on Devices, Circuits and Systems (ICCDCS) - Cancun, Mexico (2008.04.28-2008.04.30)] 2008 7th International Caribbean Conference on Devices, Circuits and Systems - Design and modeling of an RFIC pad structure and probe contact impedance correction for on-wafer measurements

[IEEE 2008 7th International Caribbean Conference on Devices, Circuits and Systems (ICCDCS) - Cancun, Mexico (2008.04.28-2008.04.30)] 2008 7th International Caribbean Conference on Devices, Circuits and Systems - Design and modeling of an RFIC pad structure and probe contact impedance correction for on-wafer measurements

Capovilla, C. E.; Tavora A. S., A.; Kretly, L. C.
  • 作者Capovilla, C. E.; Tavora A. S., A.; Kretly, L. C.
  • 文件大小672.05KB
  • 发表时间2008
  • DOI10.1109/ICCDCS.2008.4542646
  • 页码1-4
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