[IEEE 2008 IEEE Second International Conference on Biometrics: Theory, Applications and Systems - Washington, DC, USA (2008.09.29-2008.10.1)] 2008 IEEE Second International Conference on Biometrics: Theory, Applications and Systems - The Iris Challenge Evaluation 2005
Phillips, P. Jonathon; Bowyer, Kevin W.; Flynn, Patrick J.; Liu, Xiaomei; Scruggs, W. Todd
- 作者Phillips, P. Jonathon; Bowyer, Kevin W.; Flynn, Patrick J.; Liu, Xiaomei; Scruggs, W. Todd
- 文件大小5928.05KB
- 发表时间2008
- DOI10.1109/BTAS.2008.4699333
- 页码1-8