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[IEEE 2008 17th Asian Test Symposium (ATS) - Hokkaido, Japan (2008.11.24-2008.11.27)] 2008 17th Asian Test Symposium - A Test Generation Method for State-Observable FSMs to Increase Defect Coverage under the Test Length Constraint

[IEEE 2008 17th Asian Test Symposium (ATS) - Hokkaido, Japan (2008.11.24-2008.11.27)] 2008 17th Asian Test Symposium - A Test Generation Method for State-Observable FSMs to Increase Defect Coverage under the Test Length Constraint

Inoue, Ryoichi; Hosokawa, Toshinori; Fujiwara, Hideo

作者Inoue, Ryoichi; Hosokawa, Toshinori; Fujiwara, Hideo
文件大小424.83KB
发表时间2008
DOI10.1109/ats.2008.32
页码27-34

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