[IEEE 2008 9th International Conference on Solid-State and Integrated-Circuit Technology (ICSICT) - Beijing, China (2008.10.20-2008.10.23)] 2008 9th International Conference on Solid-State and Integrated-Circuit Technology - 3-D simulation of geometrical variations impact on nanoscale FinFETs

Shimeng Yu, ; Yuning Zhao, ; Yuncheng Song, ; Gang Du, ; Jinfeng Kang, ; Ruqi Han, ; Xiaoyan Liu,

作者Shimeng Yu, ; Yuning Zhao, ; Yuncheng Song, ; Gang Du, ; Jinfeng Kang, ; Ruqi Han, ; Xiaoyan Liu,
文件大小4351.97KB
发表时间2008
DOI10.1109/icsict.2008.4734551
页码408-411

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