[IEEE 2008 Eighth IEEE International Conference on Advanced Learning Technologies - Santander, Cantabria, Spain (2008.07.1-2008.07.5)] 2008 Eighth IEEE International Conference on Advanced Learning Technologies - System for Online Detection of Aberrant Responses in E-Testing
- 作者Ueno, Maomi; Okamoto, Toshio
- 文件大小391.49KB
- 发表时间2008
- DOI10.1109/icalt.2008.171
- 页码824-828
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