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[IEEE 2008 IEEE International Symposium on Software Reliability Engineering (ISSRE) - Seattle, WA, USA (2008.11.10-2008.11.14)] 2008 19th International Symposium on Software Reliability Engineering (ISSRE) - Testing Software Product Lines Using Incremental Test Generation

[IEEE 2008 IEEE International Symposium on Software Reliability Engineering (ISSRE) - Seattle, WA, USA (2008.11.10-2008.11.14)] 2008 19th International Symposium on Software Reliability Engineering (ISSRE) - Testing Software Product Lines Using Incremental Test Generation

Uzuncaova, Engin; Garcia, Daniel; Khurshid, Sarfraz; Batory, Don
  • 作者Uzuncaova, Engin; Garcia, Daniel; Khurshid, Sarfraz; Batory, Don
  • 文件大小246.92KB
  • 发表时间2008
  • DOI10.1109/issre.2008.56
  • 页码249-258
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