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[IEEE Telecommunication Technology

[IEEE Telecommunication Technology" (CriMiCo 2008) - Sevastopol, Ukraine (2008.09.8-2008.09.12)] 2008 18th International Crimean Conference - Microwave & Telecommunication Technology - Evaluation of the Schottky barrier parameters in the micron-size metal-semiconductor contacts

Averin, S. V.; Lyubchenko, V. E.
  • 作者Averin, S. V.; Lyubchenko, V. E.
  • 文件大小512.66KB
  • 发表时间2008
  • DOI10.1109/crmico.2008.4676305
  • 页码98-99
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