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[IEEE 26th IEEE VLSI Test Symposium (vts 2008) - San Diego, CA, USA (2008.04.27-2008.05.1)] 26th IEEE VLSI Test Symposium (vts 2008) - Test-Pattern Ordering for Wafer-Level Test-During-Burn-In

[IEEE 26th IEEE VLSI Test Symposium (vts 2008) - San Diego, CA, USA (2008.04.27-2008.05.1)] 26th IEEE VLSI Test Symposium (vts 2008) - Test-Pattern Ordering for Wafer-Level Test-During-Burn-In

Bahukudumbi, Sudarshan; Chakrabarty, Krishnendu

作者Bahukudumbi, Sudarshan; Chakrabarty, Krishnendu
文件大小980.51KB
发表时间2008
DOI10.1109/vts.2008.28
页码193-198

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