[IEEE 2008 40th Southeastern Symposium on System Theory (SSST) - New Orleans, LA, USA (2008.03.16-2008.03.18)] 2008 40th Southeastern Symposium on System Theory (SSST) - N-Model Tests for VLSI Circuits
- 作者Yogi, Nitin; Agrawal, Vishwani D.
- 文件大小421.48KB
- 发表时间2008
- DOI10.1109/ssst.2008.4480230
- 页码242-246
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